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Unleash The Top Features Of Wafer Mapping Sensors

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Kensington Laboratories
Unleash The Top Features Of Wafer Mapping Sensors

Sensors only detect all standard notched and flatted wafers for robust detection and even if there is a misalignment in the setup. In the scans, the sensors correctly detect the wafer seen on only one of the two scans. Wafer front end sensors are used to identify flatted wafers with multiple scans. 

For more:- https://kensingtonlabsus.blogspot.com/2021/03/unleash-top-features-of-wafer-mapping.html

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