Wafer Inspection Equipment; Indispensable for Maintaining the Production Yield of Semiconductors


During the manufacture of semiconductor wafers, wafer inspection equipment is utilised to detect faults. By getting the coordinates of the defect's position, this technology detects both pattern and physical faults. Wafer inspection's primary function is to detect faults on a wafer and determine their location coordinates. Wafer inspection equipment aids in improving semiconductor quality. Wafer inspection equipment identifies physical flaws (foreign substances known as particles) and pattern defects on wafers, as well as the defect's position coordinates (X, Y).Major defects affect both the form and function of a wafer. Dislocation loops, cracks, straight dislocations, extrinsic defects, interstitial defects, vacancy defects, uneven thickness, and Frenkel defects are some defects that are noticeable.

Wafer inspection compares the thickness, pattern, and general quality of wafers fabricated from various types of materials. Quartz and glass are the most common materials used. The quality of the wafers is checked using a variety of techniques. Many businesses handle all aspects of wafer inspection in-house. Some companies, on the other hand, have professional inspectors on staff who undertake this inspection. Wafer inspection equipment is used to detect potential faults in wafers made of lead, cadmium, or other metals in their flat state. Each of these has its own inspection process.

Each of the two types of inspections has its own set of advantages and disadvantages. The inspector compares the patterns of surrounding chips using powerful computer technology in the non-patterned inspection method. This includes comparing each side's image with the machine's regular view. This method's purpose is to detect the presence of an optical flaw. The next step is to ensure that the fault has no impact on the product's functionality or performance. Non-patterned wafer inspection technologies, on the other hand, do not detect chips that are positioned outside the wafer.This is done by carefully examining the entire device, and comparing each of its characteristics with the normal picture. Another method is done in the same manner but using electromagnetic radiation.

It's worth noting that these two techniques aren't the exclusive ones for detecting faults in wafers. There are numerous others, including UV scanning, electrical discharges, and even radio frequency interference. Each piece of wafer inspection equipment or system has its own set of advantages and disadvantages. In order to attain better levels of efficiency, manufacturers frequently combine multiple of them.

Wafer inspection equipment allows producers to test and verify the quality of semiconductor wafers before sending them to end-users in an efficient, easy, and cost-effective manner. Some wafer inspection equipment can perform both micro and macro inspections. The bulk of wafer inspection duties can be handled with this innovative, small, and cost-effective equipment.

Wafer inspection is a method of discovering flaws in wafers. As a result, inspection is critical in wafer manufacture. Wafers should always be tested to ensure that the wafer manufacturing process is successful. Furthermore, in the era of immersion lithography, monitoring wafer profiles is becoming increasingly crucial.

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Sources @ https://www.openpr.com/news/934958/wafer-inspection-equipment-market-global-industry-insights-trends-outlook-and-opportunity-analysis-2017-2025.html


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